Semiconductors and Electrical Applications

Many applications require the measurement of electrical parameters whilst making microscopic or spectroscopic observations. At Linkam, we’ve been creating sample characterisation solutions for the microelectronics and semiconductor fields for many years. We design and manufacture sample characterisation chambers with accurate temperature control ranging from < -195°C to 1500°C. The environment within the chamber can be controlled, with options for gas purging, controlled vacuum or humidity. Linkam stages can be fitted with electrical connection or gold tipped tungsten needle probes allowing the measurement of the electrical properties of the sample and their change with temperature. Linkam systems are compatible with light microscopy and spectroscopy techniques including Raman, FT-IR and X-ray.

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