Researchers used Linkam’s HFS600E-PB4 probe stage at temperatures down to -70 °C (200K), to investigate how temperature-dependent phase transitions affect the properties of piezoelectric materials, finding that ideal properties peaked around the low-temperature phase transitions.

Researchers study the effect of thermal excitation on semiconducting sensor materials using a Linkam probe stage, the HFS600E-PB4. They explore the temperature sensing performance of these semiconductor nanofilms.

Researchers use a Linkam probe stage, the HFS600E-PB4 to study the relationship between vertical interfaces and dielectric properties in thin nanocomposite films.