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Linkam Scientific

Linkam
About Us
What We Do
Our Story
Our Values
Our Team
Careers at Linkam
T&Cs and Policies
Products
Product types
Application Notes
Applications
Experimental Techniques
Custom Projects
Request a Quote
Knowledge
Application Notes
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Scientific Papers
Videos
Customer Insights
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Support Help Centre
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Michelle Coffie
25 November 2021
research paper

Investigating Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films using Linkam’s HFS600E-PB4

Michelle Coffie
25 November 2021
research paper

Researchers investigated Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films using Linkam’s HFS600E-PB4

Read the full paper here 

HFS600E-PB4

Tagged: semicon-elec, elec-semicon, thin film, thin films, oxide interfaces

Newer PostControlling Gaussian and mean curvatures at microscale by sublimation and condensation of smectic liquid crystals using a Linkam heating/cooling stage.
Older PostUsing Linkam’s FTIR600 stage for microthermometric studies in dark and opaque minerals associated to uranium mineralisation
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Linkam Scientific Instruments, Unit 9, Perrywood Business Park, Honeycrock Lane, Salfords, RH1 5DZ, United Kingdom+44 (0)1737 363 476info@linkam.co.uk

Linkam Scientific Instruments, Unit 9 Perrywood Business Park, Honeycrock Lane, Salfords, RH1 5DZ United Kingdom

+44 (0)1737 363 476    |    info@linkam.co.uk

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